Tuesday, July 9 2019
1:00pm - 5:00pm
Materials Characterization Facility | Marcus Nanotechnology Building Level 0 | 345 Ferst Drive | Atlanta GA | 30332
N/A
For more information:
Eric Woods - EM Support & Consulting;
SEM, TEM, FIB
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Keyence VHX-7000 Demonstration

The VHX Series has a depth of field that is 20 times greater than conventional optical microscopes. KEYENCE designs the lenses, cameras and graphic engine in-house, enabling observation with an optimal balance of depth and brightness. Even novice users can capture high resolution images with ease.

Using a 4K CMOS Sensor, the VHZ-7000 series can deliver 2D and 3D measurements, roughness, contamination, grain size, and other analyses with one tool. Additionally, observation can be carried out automatically at magnifications from 20× to 6000× without changing the lens.

Key Features

  • Optical Shadow Effect Mode: makes subtle contours stand out and enhances uneven surfaces and stains with the push of a button
  • Multi-Directional Light Mode: varied illumination allows users to detect subtle irregularities on a sample
  • 3D Image Stitch: capturing multiple images while the stage is moving, 3D data capture and stitching can be performed simultaneously