Thursday, September 13 2018
9:00am - 3:00pm
Marcus Nanotechnology Building Room 1116 | 345 Ferst Drive | Atlanta GA | 30332
N/A
For more information:

 Dr. Walter Henderson: walter.henderson@ien.gatech.edu

Add To My Calendar
MCF Workshop - Overview to Atomic Force Microscopy

This workshop will provide attendees first-hand knowledge on Atomic Force Microscopy (AFM). Topic that will be covered include:

  •     Theoretical basis of Atomic Force Microscopy
  •     Important considerations when choosing an AFM instrument
  •     Applications for AFM measurements
  •     Hands-on measurement with model samples

Register at: https://learnaboutafhatgt.eventbrite.com

Contact Dr. Walter Henderson at: walter.henderson@ien.gatech.edu for more information.